This drive appears OK, but is “stuck” thinking it is under-going a self test which should have completed hours ago.
smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HD321KJ
Serial Number: S0MQJ1MP400742
Firmware Version: CP100-10
User Capacity: 320,072,933,376 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Not recognized. Minor revision code: 0x52
Local Time is: Wed Jul 18 12:25:09 2007 BST
==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x85) Offline data collection activity
was aborted by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 249) Self-test routine in progress...
90% of test remaining.
Total time to complete Offline
data collection: (5839) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 100) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0007 100 100 015 Pre-fail Always - 5696
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 6
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 253 253 000 Old_age Always - 13
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 6
187 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 0
188 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 0
190 Unknown_Attribute 0x0022 062 062 000 Old_age Always - 38
194 Temperature_Celsius 0x0022 124 124 000 Old_age Always - 38
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 20942
196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0
201 Soft_Read_Error_Rate 0x000a 253 253 000 Old_age Always - 0
202 TA_Increase_Count 0x0032 253 253 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.