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unix:debian:raidlogs:sdf

RAIDlogs: SDF

SMART status

This drive appears OK, but is “stuck” thinking it is under-going a self test which should have completed hours ago.

smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG HD321KJ
Serial Number:    S0MQJ1MP400742
Firmware Version: CP100-10
User Capacity:    320,072,933,376 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  Not recognized. Minor revision code: 0x52
Local Time is:    Wed Jul 18 12:25:09 2007 BST

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x85)	Offline data collection activity
					was aborted by an interrupting command from host.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      ( 249)	Self-test routine in progress...
					90% of test remaining.
Total time to complete Offline 
data collection: 		 (5839) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 100) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   253   253   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0007   100   100   015    Pre-fail  Always       -       5696
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       6
  5 Reallocated_Sector_Ct   0x0033   253   253   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   253   253   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   253   253   015    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   253   253   000    Old_age   Always       -       13
 10 Spin_Retry_Count        0x0033   253   253   051    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x0012   253   253   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       6
187 Unknown_Attribute       0x0032   253   253   000    Old_age   Always       -       0
188 Unknown_Attribute       0x0032   253   253   000    Old_age   Always       -       0
190 Unknown_Attribute       0x0022   062   062   000    Old_age   Always       -       38
194 Temperature_Celsius     0x0022   124   124   000    Old_age   Always       -       38
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       20942
196 Reallocated_Event_Count 0x0032   253   253   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   253   253   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   253   253   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   Always       -       0
201 Soft_Read_Error_Rate    0x000a   253   253   000    Old_age   Always       -       0
202 TA_Increase_Count       0x0032   253   253   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
unix/debian/raidlogs/sdf.txt · Last modified: 2007/07/18 11:28 (external edit)